Arithmetic Built-In Self-Test For Embedded Systems

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  • Publish Date: 1997-10-01
  • Binding: Hardcover
  • Author: Janusz Rajski;Jerzy Tyszer

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Describes the software-based, built-in, self-testing for systems with embedded processors that engineers are increasingly using as early as possible in the design process to prevent costly prototyping turns. Offers tutorials, schemes to generate tests employing adders and multipliers, an accumulator-based scheme for the parallel compaction of test responses, fault simulation techniques, and applications. Annotation c. by Book News, Inc., Portland, Or.

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